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Conference Papers Year : 2014

Radiation Damage Tests at 1 Grad Dose on 65 nm CMOS Transistors

M. Barbero
  • Function : Author
Centre de Physique des Particules de Marseille

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Instrumentation and Detectors [physics.ins-det]

Danielle Cristofol  : Connect in order to contact the contributor

https://in2p3.hal.science/in2p3-00996607

Submitted on : Monday, May 26, 2014-4:19:31 PM

Last modification on : Thursday, April 11, 2024-1:18:12 PM

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in2p3-00996607 , version 1 (26-05-2014)

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  • HAL Id : in2p3-00996607 , version 1

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M. Barbero. Radiation Damage Tests at 1 Grad Dose on 65 nm CMOS Transistors. Front End Electronics (FEE 2014), May 2014, Chicago, United States. ⟨in2p3-00996607⟩

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