Surface event rejection of the EDELWEISS cryogenic germanium detectors based on NbSi thin film sensors - IN2P3 - Institut national de physique nucléaire et de physique des particules
Journal Articles Journal of Low Temperature Physics Year : 2008

Surface event rejection of the EDELWEISS cryogenic germanium detectors based on NbSi thin film sensors

Abstract

Near-surface-events are a major limitation to the performance of cryogenic massive germanium heat and ionisation detectors for dark matter search, due to their incomplete charge collection. We present here a powerful method of surface event identification based on the transient heat signal of a Ge bolometer, equipped with two NbSi high impedance thin film sensors. Calibration runs using electrons and low energy gamma particles from a Cd-109 source show highly effective surface event rejection down to the heat threshold energy. Neutron and gamma source calibrations were realised to get information on the fiducial volume of the Ge absorber. First results from low background data taking are discussed.

Dates and versions

in2p3-00854953 , version 1 (28-08-2013)

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Cite

S. Marnieros, L. Berge, A. Broniatowski, M. Chapellier, S. Collin, et al.. Surface event rejection of the EDELWEISS cryogenic germanium detectors based on NbSi thin film sensors. Journal of Low Temperature Physics, 2008, 151, pp.835-840. ⟨10.1007/s10909-008-9753-2⟩. ⟨in2p3-00854953⟩
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