A 20 kpixels CdTe photon-counting imager using XPAD chip
Résumé
A 20 kpixels CdTe sensor has been hybridized on XPAD3S CMOS photon counting chips, forming a 19200 pixels imaging device. P-type CdTe with rectifying contact has been employed. This sensor works in hole collection mode with a pulse shaping time of about 150 ns. Detector construction and operation are described and first results obtained with 241Am source as well as diffraction images using an X-ray synchrotron beam are presented. Polarisation effects are present but remain at a very manageable level. Keywords: pixel detector, photon counting, CdTe, hole collection, XPAD3