Journal Articles
Progress in Crystal Growth and Characterization of Materials
Year : 1984
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https://in2p3.hal.science/in2p3-00019470
Submitted on : Thursday, May 31, 2001-9:06:02 AM
Last modification on : Thursday, April 11, 2024-1:18:11 PM
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- HAL Id : in2p3-00019470 , version 1
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R. Stuck, P. Siffert. Secondary ion mass spectrometry (SIMS). Progress in Crystal Growth and Characterization of Materials, 1984, 8, pp.11-57. ⟨in2p3-00019470⟩
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