Conference Papers
Nuclear Instruments and Methods
Year : 1978
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https://in2p3.hal.science/in2p3-00018018
Submitted on : Tuesday, November 7, 2000-4:22:13 PM
Last modification on : Thursday, April 11, 2024-1:18:11 PM
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- HAL Id : in2p3-00018018 , version 1
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C. Heitz, M. Kwadow, D. Tenorio. Surface analysis by argon ion induced X-ray fluorescence. International Conference on Ion Beam Analysis 3, Jun 1977, Washington, United States. pp.483-488. ⟨in2p3-00018018⟩
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