On depth profiling from pixe yields - IN2P3 - Institut national de physique nucléaire et de physique des particules
Journal Articles Journal of Radioanalytical and Nuclear Chemistry Letters Year : 1987

On depth profiling from pixe yields

P. Regnier
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in2p3-00016658 , version 1 (30-08-2000)

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  • HAL Id : in2p3-00016658 , version 1

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P. Regnier, I. Brissaud. On depth profiling from pixe yields. Journal of Radioanalytical and Nuclear Chemistry Letters, 1987, 117, pp.111-120. ⟨in2p3-00016658⟩
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