On depth profiling from pixe yields

P. Regnier; I. Brissaud

Journal Articles Journal of Radioanalytical and Nuclear Chemistry Letters Year : 1987

On depth profiling from pixe yields

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P. Regnier

Function : Author

I. Brissaud

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Institut de Physique Nucléaire d'Orsay

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Nuclear Experiment [nucl-ex]

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https://in2p3.hal.science/in2p3-00016658

Submitted on : Wednesday, August 30, 2000-4:46:17 PM

Last modification on : Thursday, April 11, 2024-1:18:11 PM

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in2p3-00016658 , version 1 (30-08-2000)

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P. Regnier, I. Brissaud. On depth profiling from pixe yields. Journal of Radioanalytical and Nuclear Chemistry Letters, 1987, 117, pp.111-120. ⟨in2p3-00016658⟩

On depth profiling from pixe yields

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