Thick target x-ray yields and intensity ratios for MeV Br and Kr ion impact and application to the analysis of ottery - IN2P3 - Institut national de physique nucléaire et de physique des particules
Journal Articles Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Year : 1986

Thick target x-ray yields and intensity ratios for MeV Br and Kr ion impact and application to the analysis of ottery

D. Tenorio
  • Function : Author
G. Costa
  • Function : Author
Institut de Recherches Subatomiques
M. Bordas
  • Function : Author
J. Larcher
  • Function : Author
G. Lagarde
  • Function : Author
C. Heitz
  • Function : Author
Institut de Recherches Subatomiques
A. Jaidar
  • Function : Author

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Chemical Physics [physics.chem-ph]

Yvette Heyd  : Connect in order to contact the contributor

https://in2p3.hal.science/in2p3-00006387

Submitted on : Tuesday, October 3, 2000-8:27:12 AM

Last modification on : Monday, September 23, 2024-9:22:24 AM

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in2p3-00006387 , version 1 (03-10-2000)

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  • HAL Id : in2p3-00006387 , version 1

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D. Tenorio, G. Costa, M. Bordas, J. Larcher, G. Lagarde, et al.. Thick target x-ray yields and intensity ratios for MeV Br and Kr ion impact and application to the analysis of ottery. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1986, 15, pp.612. ⟨in2p3-00006387⟩

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