Bulk optical absorption of high resistivity silicona at 1550 nm
Abstract
We report on the measurement of the optical absorption of bulk crystalline silicon at 1550 nm. Using the photodeflection technique, absorption as low as 5 ppm/cm has been measured on a sample with a resistivity of 10 kΩ⋅cm . The absorption as a function of the resistivity has been derived for n-type silicon.