Influence of beam conditions and energy for SEE testing

V. Ferlet-Cavrois; J.R. Schwank; S. Liu; M. Muschitiello; Th. Beutier; A. Javanainen; A. Hedlund; C. Poivey; A. Zadeh; R. Harboe-Sorensen; G. Santin; B. Nickson; A. Menicucci; C. Binois; D. Peyre; S.K. Hoeffgen; S. Metzger; D. Schardt; H. Kettunen; A. Virtanen; G. Berger; B. Piquet; J.C. Foy; M. Zafrani; P. Truscott; M. Poizat; F. Bezerra

doi:10.1109/RADECS.2011.6131365

Conference Papers Year : 2011

Influence of beam conditions and energy for SEE testing

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V. Ferlet-Cavrois

Function : Author

J.R. Schwank

Function : Author

S. Liu

Function : Author

M. Muschitiello

Function : Author

Th. Beutier

Function : Author

Astrium [Toulouse]

A. Javanainen

Function : Author
PersonId : 766161
ORCID : 0000-0001-7906-3669

A. Hedlund

Function : Author

C. Poivey

Function : Author

A. Zadeh

Function : Author

R. Harboe-Sorensen

Function : Author

G. Santin

Function : Author

B. Nickson

Function : Author

A. Menicucci

Function : Author

C. Binois

Function : Author

Astrium [Toulouse]

D. Peyre

Function : Author

Astrium [Toulouse]

S.K. Hoeffgen

Function : Author

S. Metzger

Function : Author

D. Schardt

Function : Author

H. Kettunen

Function : Author

A. Virtanen

Function : Author

G. Berger

Function : Author

B. Piquet

Function : Author

Grand Accélérateur National d'Ions Lourds

J.C. Foy

Function : Author

Grand Accélérateur National d'Ions Lourds

M. Zafrani

Function : Author

P. Truscott

Function : Author

M. Poizat

Function : Author

F. Bezerra

Function : Author

Centre National d'Études Spatiales [Toulouse]

Abstract

The effects of heavy-ion test conditions and beam energy on device response are investigated. These effects are illustrated with two types of test vehicles; SRAMs and power MOSFETs. In addition, GEANT4 simulations have also been performed to better understand the results.

Keywords

Power MOSFETs SRAM ion beam energy specie effect

Domains

Materials Science [cond-mat.mtrl-sci]

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https://in2p3.hal.science/in2p3-00695719

Submitted on : Wednesday, May 9, 2012-4:39:32 PM

Last modification on : Thursday, April 11, 2024-1:18:12 PM

Dates and versions

in2p3-00695719 , version 1 (09-05-2012)

Identifiers

HAL Id : in2p3-00695719 , version 1
DOI : 10.1109/RADECS.2011.6131365

Cite

V. Ferlet-Cavrois, J.R. Schwank, S. Liu, M. Muschitiello, Th. Beutier, et al.. Influence of beam conditions and energy for SEE testing. 12th European Conference on Radiation and its Effects on Components and Systems (RADECS), Sep 2011, Sevilla, Spain. pp.690-699, ⟨10.1109/RADECS.2011.6131365⟩. ⟨in2p3-00695719⟩

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Influence of beam conditions and energy for SEE testing

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