Fracture processes studied in CRESST - IN2P3 - Institut national de physique nucléaire et de physique des particules Access content directly
Conference Papers Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment Year : 2006

Fracture processes studied in CRESST

J. Angström
  • Function : Author
F. Pröbst
  • Function : Author
L. Stodolsky
  • Function : Author
J. Timonen
  • Function : Author
C. Bucci
  • Function : Author
S. Cooper
  • Function : Author
C. Cozzini
  • Function : Author
F.V. Feilitzsch
  • Function : Author
H. Kraus
  • Function : Author
J. Marchese
  • Function : Author
O. Meier
  • Function : Author
U. Nagel
  • Function : Author
Y. Ramachers
  • Function : Author
W. Seidel
  • Function : Author
M. Sisti
  • Function : Author
S. Uchaikin
  • Function : Author
L. Zerle
  • Function : Author

Abstract

In the early stages of running of the CRESST dark matter search with sapphire crystals as detectors, an unexpectedly high rate of signal pulses appeared. Their origin was finally traced to fracture events in the sapphire due to the very tight clamping of the detectors. During extensive runs the energy and time of each event was recorded, providing large data sets for such phenomena. We believe this is the first time that the energy release in fracture has been accurately measured on a microscopic event-by-event basis. The energy distributions appear to follow a power law, dN/dEis proportional to E-β, similar to the Gutenberg–Richter power law for earthquake magnitudes, and after appropriate translation, with a similar exponent. In the time domain, the autocorrelation function shows time correlations lasting for substantial parts of an hour. Some remarks are made concerning the possible role of such mechanical stress release processes in the noise of sensitive cryodetectors.

Dates and versions

in2p3-00026022 , version 1 (05-05-2006)

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Cite

J. Angström, F. Pröbst, P.C.F. Di Stefano, L. Stodolsky, J. Timonen, et al.. Fracture processes studied in CRESST. 11th International Workshop on Low Temperature Detectors - LTD-11, Jul 2005, Tokyo, Japan. pp.754-756, ⟨10.1016/j.nima.2005.12.127⟩. ⟨in2p3-00026022⟩
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