Release of Kr, Ag, Sn, I and Xe from UC$_x$ targets
B. Roussière
(1)
,
O. Bajeat
(1)
,
N. Barré
(1)
,
C. Bourgeois
(1)
,
F. Clapier
(1)
,
E. Cottereau
,
C. Donzaud
(1)
,
M. Ducourtieux
(1)
,
S. Essabaa
(1)
,
D. Guillemaud-Mueller
(1)
,
F. Ibrahim
(1)
,
C. Lau
(1)
,
F. Le Blanc
(1)
,
H. Lefort
(1)
,
C.F. Liang
(2)
,
A.C. Mueller
(1)
,
J. Obert
(1)
,
N. Pauwels
(1)
,
J.C. Potier
(1)
,
F. Pougheon
(1)
,
J. Proust
(1)
,
J. Sauvage
(1)
,
O. Sorlin
(1)
,
D. Verney
(1)
,
A. Wojtasiewicz
B. Roussière
- Function : Author
- PersonId : 747599
- IdHAL : brigitte-roussiere
- ORCID : 0000-0002-4731-6972
E. Cottereau
- Function : Author
A. Wojtasiewicz
- Function : Author
Abstract
The release properties of a UCx thick target associated with a hot plasma ion source have been studied. Measurements have been performed for various elements: Kr, Ag, Sn, I and Xe. The analysis is made assuming pure diffusion or pure effusion as the release processes. The results obtained are compared to the data available in the literature.