Journal Articles
Journal of Applied Physics
Year : 1992
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https://in2p3.hal.science/in2p3-00019443
Submitted on : Wednesday, May 30, 2001-10:07:47 AM
Last modification on : Thursday, April 11, 2024-1:18:11 PM
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- HAL Id : in2p3-00019443 , version 1
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M.C. Busch, A. Slaoui, P. Siffert, E. Dooryhee, M. Toulemonde. Structural and electrical damage induced by high-energy heavy ions in SiO$_2$/Si structures. Journal of Applied Physics, 1992, 71, pp.2596-2601. ⟨in2p3-00019443⟩
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