Conference Papers
Year : 1996
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https://in2p3.hal.science/in2p3-00019026
Submitted on : Wednesday, February 21, 2001-10:37:47 AM
Last modification on : Friday, August 23, 2024-9:32:04 AM
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- HAL Id : in2p3-00019026 , version 1
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J.C. Vanel. APD's excess noise measurements using spectral analysis(FFT). Conference on New Developments in Photodetection 1, Jun 1996, Beaune, France. ⟨in2p3-00019026⟩
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