Journal Articles
Applied Physics
Year : 1979
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https://in2p3.hal.science/in2p3-00018429
Submitted on : Wednesday, December 20, 2000-2:42:00 PM
Last modification on : Thursday, April 11, 2024-1:18:11 PM
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- HAL Id : in2p3-00018429 , version 1
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M. Hage-Ali, R. Stuck, A.N. Saxena, P. Siffert. Studies of CdTe surfaces with secondary ion mass spectrometry, Rutherford backscattering and ellipsometry. Applied Physics, 1979, 19, pp.25-33. ⟨in2p3-00018429⟩
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