Analysis of superconducting thin films by ion beam methods. Comparison of nuclear techniques and SIMS

J.P. Stoquert; E. Fogarassy; R. Stuck; G. Guillaume; P. Siffert; J. Perriere

Journal Articles Surface and Interface Analysis Year : 1990

Analysis of superconducting thin films by ion beam methods. Comparison of nuclear techniques and SIMS

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J.P. Stoquert

Function : Author

Institut de Recherches Subatomiques

E. Fogarassy

Function : Author

Institut de Recherches Subatomiques

R. Stuck

Function : Author

Institut de Recherches Subatomiques

G. Guillaume

Function : Author

Institut de Recherches Subatomiques

P. Siffert

Function : Author

Institut de Recherches Subatomiques

J. Perriere

Function : Author

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in2p3-00016159 , version 1 (29-06-2000)

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J.P. Stoquert, E. Fogarassy, R. Stuck, G. Guillaume, P. Siffert, et al.. Analysis of superconducting thin films by ion beam methods. Comparison of nuclear techniques and SIMS. Surface and Interface Analysis, 1990, 15, pp.57. ⟨in2p3-00016159⟩

Analysis of superconducting thin films by ion beam methods. Comparison of nuclear techniques and SIMS

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