Journal Articles
Surface and Interface Analysis
Year : 1990
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https://in2p3.hal.science/in2p3-00016159
Submitted on : Thursday, June 29, 2000-8:17:44 AM
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- HAL Id : in2p3-00016159 , version 1
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J.P. Stoquert, E. Fogarassy, R. Stuck, G. Guillaume, P. Siffert, et al.. Analysis of superconducting thin films by ion beam methods. Comparison of nuclear techniques and SIMS. Surface and Interface Analysis, 1990, 15, pp.57. ⟨in2p3-00016159⟩
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