Conference Papers
Year : 1992
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https://in2p3.hal.science/in2p3-00015895
Submitted on : Tuesday, May 30, 2000-4:14:22 PM
Last modification on : Thursday, April 11, 2024-1:18:11 PM
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- HAL Id : in2p3-00015895 , version 1
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L. Johann, R. Sruck, P. Kern, B. Sipp, P. Siffert. Development of a resonant ionization mass spectrometer for surface analysis. Ris 92, May 1992, Santa Fe, United States. pp.283-286. ⟨in2p3-00015895⟩
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