Conference Papers
Applied Surface Science
Year : 1991
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https://in2p3.hal.science/in2p3-00013246
Submitted on : Monday, May 31, 1999-3:50:44 PM
Last modification on : Thursday, April 11, 2024-1:18:11 PM
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- HAL Id : in2p3-00013246 , version 1
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A. Chevarier, N. Chevarier, M. El Bouanani, E. Gerlic, M. Stern, et al.. Profiling and nuclear reaction spectroscopy of carbon oxygen and argon contamination in sputter-deposited films using nuclear backscattering. International Conference On Solid Films And Surfaces 5, Aug 1990, Providence, United States. pp.215-221. ⟨in2p3-00013246⟩
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