High resolution depth profiling of light elements in high atomic mass materials - IN2P3 - Institut national de physique nucléaire et de physique des particules
Conference Papers Nuclear Instruments and Methods in Physics Research Year : 1983

High resolution depth profiling of light elements in high atomic mass materials

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https://in2p3.hal.science/in2p3-00004065

Submitted on : Wednesday, March 8, 2000-9:36:15 AM

Last modification on : Monday, September 23, 2024-10:56:17 AM

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in2p3-00004065 , version 1 (08-03-2000)

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  • HAL Id : in2p3-00004065 , version 1

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J.-P. Thomas, M. Fallavier, D. Ramdane, N. Chevarier, A. Chevarier. High resolution depth profiling of light elements in high atomic mass materials. International Conference On Ion Beam Analysis 6, May 1983, Tempe, United States. pp.125-128. ⟨in2p3-00004065⟩

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