Radiation-induced degradation of polyethersulphone films studied by fluorescent X-ray emission spectroscopy - IN2P3 - Institut national de physique nucléaire et de physique des particules Access content directly
Journal Articles Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Year : 1999

Radiation-induced degradation of polyethersulphone films studied by fluorescent X-ray emission spectroscopy

E.Z. Kurmaev
  • Function : Author
R.P. Winarski
  • Function : Author
K. Endo
  • Function : Author
T. Ida
  • Function : Author
A. Moewes
  • Function : Author
D.L. Ederer
  • Function : Author
S.N. Shamin
  • Function : Author
V.A. Trofimova
  • Function : Author
Y.M. Yarmoshenko
  • Function : Author
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Dates and versions

in2p3-00003145 , version 1 (29-10-1999)

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  • HAL Id : in2p3-00003145 , version 1

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E.Z. Kurmaev, R.P. Winarski, K. Endo, T. Ida, A. Moewes, et al.. Radiation-induced degradation of polyethersulphone films studied by fluorescent X-ray emission spectroscopy. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1999, 155, pp.431-439. ⟨in2p3-00003145⟩
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