Radiation-induced degradation of polyethersulphone films studied by fluorescent X-ray emission spectroscopy

E.Z. Kurmaev; R.P. Winarski; K. Endo; T. Ida; A. Moewes; D.L. Ederer; J.C. Pivin; S.N. Shamin; V.A. Trofimova; Y.M. Yarmoshenko

Journal Articles Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Year : 1999

Radiation-induced degradation of polyethersulphone films studied by fluorescent X-ray emission spectroscopy

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E.Z. Kurmaev

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R.P. Winarski

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K. Endo

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T. Ida

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A. Moewes

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D.L. Ederer

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J.C. Pivin

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Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse

S.N. Shamin

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V.A. Trofimova

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Y.M. Yarmoshenko

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Jocelyne Lorgeril : Connect in order to contact the contributor

https://in2p3.hal.science/in2p3-00003145

Submitted on : Friday, October 29, 1999-11:41:10 AM

Last modification on : Thursday, April 11, 2024-1:18:11 PM

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in2p3-00003145 , version 1 (29-10-1999)

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HAL Id : in2p3-00003145 , version 1

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E.Z. Kurmaev, R.P. Winarski, K. Endo, T. Ida, A. Moewes, et al.. Radiation-induced degradation of polyethersulphone films studied by fluorescent X-ray emission spectroscopy. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1999, 155, pp.431-439. ⟨in2p3-00003145⟩

Radiation-induced degradation of polyethersulphone films studied by fluorescent X-ray emission spectroscopy

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